The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2010

Filed:

Jul. 21, 2009
Applicant:

Takeshi Mochizuki, Ibaraki, JP;

Inventor:

Takeshi Mochizuki, Ibaraki, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 15/14 (2006.01); B41J 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical scanning device is disclosed, including: a light deflection part, an imaging optical element, a variable focus optical element, and a focal point control device. The light deflection part repeatedly deflects and scans a light flux emitted from a light source on a scan surface. The imaging optical element forms an image in a vicinity of the scan surface with the light flux. The focal point control device changes a focal distance of the variable focus optical element, which is arranged in an optical path from the light source to the light deflection part, in executing each of deflection scans, and correct an image misalignment on the scan surface due to an optical path difference for each scan angle.


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