The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
May. 07, 2008
Cheol-gyu Hwang, Daejeon-si, KR;
Sung-tae Choi, Hwaseong-si, KR;
Young-hwan Kim, Hwaseong-si, KR;
Jung-han Choi, Hwaseong-si, KR;
Dong-hyun Lee, Anyang-si, KR;
Jae-hyon Kim, Suwon-si, KR;
Hyun-cheol Park, Daejeon-si, KR;
Yu-sung Lee, Daejeon-si, KR;
Han-kil Lee, Busan-si, KR;
Cheol-gyu Hwang, Daejeon-si, KR;
Sung-tae Choi, Hwaseong-si, KR;
Young-hwan Kim, Hwaseong-si, KR;
Jung-han Choi, Hwaseong-si, KR;
Dong-hyun Lee, Anyang-si, KR;
Jae-hyon Kim, Suwon-si, KR;
Hyun-cheol Park, Daejeon-si, KR;
Yu-sung Lee, Daejeon-si, KR;
Han-kil Lee, Busan-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
Provided is a switched beam-forming apparatus which includes a beam-forming unit forming a plurality of beams using an array antenna, a beam selection adjusting unit measuring Quality of Service (QoS) values of each of a plurality of signals received through the plurality of beams, a beam selecting unit selecting at least two beams with high QoS from among the plurality of beams according to the results of the QoS measuring, and a beam combining unit combining the at least two beams selected by the beam selecting unit.