The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Mar. 28, 2008
Shinichiro Ikeda, Kasugai, JP;
Shinichiro Ikeda, Kasugai, JP;
Fujitsu Semiconductor Limited, Yokohama, JP;
Abstract
To provide a semiconductor module and a semiconductor device enabling more accurate testing of the connection state of the internal wiring between the semiconductor devices. The semiconductor device has switches SWthrough SWthat connect a test terminal TT to one end side of wires to be tested, and transistors Mthrough Mthat supply a ground potential VSS to the other end side of the wires to be tested. When a power source potential VDD is supplied to one end of the wires to be tested and a ground potential VSS is supplied to the other end of the wires to be tested, a current path can be formed including the wires to be tested. If a power source potential VDD is supplied to the wires to be tested and a ground potential VSS is supplied to the wires which are not to be tested, a difference in potential can be generated between the wires to be tested and the rest of the wires, which makes it possible to detect a short circuit failure.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile