The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Feb. 15, 2007
Byung-uk Kim, Gyeonggi-do, KR;
Ki-beom Lee, Gyeonggi-do, KR;
Yong-woo Kim, Gyeonggi-do, KR;
Mi-sun Park, Gyeonggi-do, KR;
Jin-sup Hong, Gyeonggi-do, KR;
Wy-yong Kim, Gyeonggi-do, KR;
Byung-Uk Kim, Gyeonggi-do, KR;
Ki-Beom Lee, Gyeonggi-do, KR;
Yong-Woo Kim, Gyeonggi-do, KR;
Mi-Sun Park, Gyeonggi-do, KR;
Jin-Sup Hong, Gyeonggi-do, KR;
Wy-Yong Kim, Gyeonggi-do, KR;
Dongjin Semichem Co., Ltd., Incheon, KR;
Abstract
A system for testing a flat panel display having a flat display panel assembly includes a testing stage for arranging the flat display panel assembly, a measuring apparatus being disposed on the testing stage and for measuring a spectrum of a transmitted light passing through a measuring region of the flat display panel assembly from a light source, a transporting apparatus for moving the measuring apparatus at a constant acceleration on the testing stage, a defect informing apparatus being electrically connected to the measuring apparatus and for informing an existence of defect, a type of defect, and a severity of defect by processing an electrical signal of the spectrum transmitted from the measuring apparatus.