The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
May. 17, 2010
Philip M. Hoyt, Murray, UT (US);
Arthur K. Fox, Murray, UT (US);
Philip M. Hoyt, Murray, UT (US);
Arthur K. Fox, Murray, UT (US);
Electromechanical Technologies, Inc., Murray, UT (US);
Abstract
An in-line inspection tool comprising primary and secondary sensor suites is disclosed. The primary sensor suite may detect both interior and exterior defects. The secondary sensor suite may comprise a plurality of housings distributed in the circumferential direction around the body of the tool. Each housing may contain at least one flux sensor and at least one flux concentrator. The flux concentrator may increase the flux delivered to the flux sensor, thereby increasing the sensitivity of the secondary sensor suite while reducing the number of flux sensors required. The secondary sensor suite may detect substantially exclusively interior defects. By comparing the outputs of the primary and secondary sensor suites, a user may determine whether a defect is located on the interior or exterior of a pipeline being inspected.