The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Sep. 04, 2008
Mu Chen, Knoxville, TN (US);
Michael E. Casey, Louisville, TN (US);
Mu Chen, Knoxville, TN (US);
Michael E. Casey, Louisville, TN (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
A method for determining quality of sinograms produced by a medical imaging device. The method may include placing a uniform phantom object in the field of view of the medical imaging device; acquiring one or more phantom sinograms of the uniform phantom object; establish a set of parameters for the acquired one or more phantom sinograms; and determine, based on pre-set ranges of the parameters, the quality of sinograms produced by the medical imaging device. The parameters may be one or more parameters of a group of parameters consisting of block uniformity, block efficiency, randoms rate, scanner efficiency, and scatter ratio.