The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Oct. 31, 2006
Paul L.a.m. Corstjens, Leiderdorp, NL;
Keith Kardos, Bethlehem, PA (US);
R. Sam Niedbala, Allentown, PA (US);
Hans J. Tanke, Leiden, NL;
Michel Zuiderwijk, Alphen, NL;
Hans H. Feindt, Catonsville, MD (US);
Vijay K. Mokkapati, Macungie, PA (US);
Jess Aaron Kimball, Portland, OR (US);
Paul L.A.M. Corstjens, Leiderdorp, NL;
Keith Kardos, Bethlehem, PA (US);
R. Sam Niedbala, Allentown, PA (US);
Hans J. Tanke, Leiden, NL;
Michel Zuiderwijk, Alphen, NL;
Hans H. Feindt, Catonsville, MD (US);
Vijay K. Mokkapati, Macungie, PA (US);
Jess Aaron Kimball, Portland, OR (US);
Orasure Technologies, Inc., Bethlehem, PA (US);
Abstract
A lateral flow test strip for the analysis of a sample featuring numerous capture zones arranged in an array such that each capture zone is substantially equidistant from the sample containing area. The sample does not pass through another capture zone to reach any one of the other capture zones. The capture zones are preferably arranged in a linear array perpendicular to the flow of the sample through the lateral flow test strip. The lateral flow test strip allows for an increased number of simultaneous analyses of numerous analytes from one sample to occur on one lateral flow test strip.