The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
May. 27, 2005
Yong Min Kim, Daejeon, KR;
Sung Woon Lee, Daejeon, KR;
Asbjorn Smitt, London, GB;
Sigrid Smitt-jeppesen, Reston, VA (US);
Yong Min Kim, Daejeon, KR;
Sung Woon Lee, Daejeon, KR;
Asbjorn Smitt, London, GB;
Sigrid Smitt-Jeppesen, Reston, VA (US);
VIDAR Systems Corporation, Herndon, VA (US);
Abstract
An apparatus for optical sensing of samples includes an optical source, an optical assembly being rotatable about an axis, a sample holder, and a detector. The optical assembly rotates, allowing the sensing apparatus to sense results from plural locations on a sample without moving the sample. Moving the sample in a linear direction while rotating the optical assembly allows sensing of an entire sample containing multiple test sites, such as a biochip. An optical assembly containing mirrors to direct light from the optical source to the sample is provided. Preferably, light enters the optical assembly along the axis of rotation. Sensing methods consistent with the invention are also described.