The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Mar. 27, 2008
Christoph Fattinger, Blauen, CH;
Thomas Zumstein, Weil am Rhein, DE;
Remo Anton Hochstrasser, Oberwil, CH;
Dieter Voegelin, Sissach, CH;
Christoph Fattinger, Blauen, CH;
Thomas Zumstein, Weil am Rhein, DE;
Remo Anton Hochstrasser, Oberwil, CH;
Dieter Voegelin, Sissach, CH;
F. Hoffmann-LaRoche AG, Basel, CH;
Abstract
A stacker () for storing a plurality of microplates each having a top surface side and a bottom surface side opposed to the top surface side, comprises a housing and a removal gate () for removing a microplate of the plurality of microplates out of the housing. The stacker () is arranged to accommodate the plurality of microplates inside the housing such that the top surface side of one microplate of the plurality of microplates abuts on the bottom surface side of an adjacent microplate of the plurality of microplates and such that the housing adjoins to the plurality of microplates. Using such a stacker, the plurality of microplates can be arranged and stored in a compact manner wherein the single microplates of the plurality of microplates can still selectively and efficiently be accessed. Further, due to the controlled access to the plurality of microplates being arranged inside the housing of the described stackervia the removal gate, icing of the microplates can be minimized when the stacker is cooled for long term storage of samples arranged inside the microplates.