The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Jun. 26, 2006
Toshiki Saito, Suwa, JP;
Hiroshi Hasegawa, Chino, JP;
Toshiki Saito, Suwa, JP;
Hiroshi Hasegawa, Chino, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
A projection image position adjustment method of applying position adjustment to, using two adjustment images, two projection images on a projection surface projected to have an overlay area by two of a plurality of projectors in a multi-projection display. The method includes: a first step of providing, to the two projectors, two adjustment image data respectively corresponding to the two adjustment images each showing a pattern of specific characteristics in the overlay area when the two adjustment images are projected with an appropriate positional relationship; a second step of calculating an evaluation value correlated to the characteristics based on image capture data that is derived by capturing an image of the projection surface with the two adjustment images projected thereon by the two projectors; and a third step of subjecting the two projection images to the position adjustment based on the evaluation values.