The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Jan. 17, 2007
Freerk Syassen, Stadland, DE;
Freerk Syassen, Stadland, DE;
Airbus Deutschland GmbH, , DE;
Abstract
A device and method for acquiring deviations between a desired contour and an actual contour of a flexible component, in particular of a large-format metal sheet, taking into account the component's own weight. The device includes a plurality of stamps, arranged on a base area to form a stamp field, for accommodating the component at points of support, wherein each stamp comprises at least one force measuring sensor for measuring a weight force Fthat acts at the point of support, and at least one distance measuring sensor for measuring a travel path Stravelled by the stamp. For each point of support a theoretical weight force Fand/or a theoretical travel path Scan be determined from component data, wherein the force measuring sensors and the distance measuring sensors are coupled to the computing unit, and the stamps are designed so as to be controlled by the computing unit, and independently of each other can travel at least essentially perpendicularly to the base area.