The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Nov. 15, 2007
Stephen K. Ferguson, Lawrenceville, GA (US);
Stephen K. Ferguson, Lawrenceville, GA (US);
Micron Optics Inc., Atlanta, GA (US);
Abstract
The current invention relates to optical gages designed to measure strain on the surface of a test specimen. The gages of this invention is designed to be installed and used in a manner similar to conventional electronic foil strain gages, but to have the advantages of an all-optical gage. The gage of this invention is constructed to allow surface strain on the test specimen to be transferred to a length of optical fiber containing a fiber Bragg grating (FBG). As strain is applied to the fiber, the optical spectrum center wavelength reflected by the Bragg grating shifts in wavelength. This shift in wavelength can be converted directly to units of strain. The current invention provides a gage carrier design for use with fiber optic strain sensors comprising one or more FBGs which provide the benefits of a carrier for ease of handling and mounting without degrading gage performance. The gage carrier provides features that allow the FBG to be precisely positioned and securely bonded to the test specimen in a controlled manner. The carrier additionally provides fiber protection to the installed FBG.