The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 2010

Filed:

Jul. 10, 2009
Applicants:

Arnaud Allezy, San Francisco, CA (US);

Laurent Blanchard, Mouans-Sartoux, FR;

Christian Hochard, Marseille Cedex, FR;

François Guinot, Marseille Cedex, FR;

Inventors:

Arnaud Allezy, San Francisco, CA (US);

Laurent Blanchard, Mouans-Sartoux, FR;

Christian Hochard, Marseille Cedex, FR;

François Guinot, Marseille Cedex, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a measuring tape () comprising a stack of at least two layers, characterized in that it also includes a first layer, called support layer, based on composite material () and a layer, called top layer, () based on a polymer having a high glass transition temperature so that, in conditions of use, said polymer is in a glassy state to maintain the element in the wound or folded position. The invention also relates to a deployable structure including said measuring tape intended notably for space applications.


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