The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 28, 2010
Filed:
Sep. 04, 2008
Alfred Affa, Stein/Traun, DE;
Alfred Affa, Stein/Traun, DE;
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
A linear measuring arrangement for measuring a relative position of two objects, the linear measuring arrangement including guide surfaces, a scale having a measuring graduation and a scanning carriage for scanning the measuring graduation, wherein the scanning carriage is linearly guided in a measuring direction on the guide surfaces. The linear measuring arrangement further including a carrier device which can be fastened to one of the two objects and a coupling, by which the scanning carriage is coupled to the carrier device rigidly in the measuring direction and transversely thereto resiliently. The coupling includes a first coupling element, having a first coupling face, arranged on the scanning carriage and a second coupling element, having a second coupling face, arranged on the carrier device, wherein the second coupling face contacts the first coupling face and wherein at least one of the first and second coupling elements is made of a ceramic material at least in an area of a contact.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile