The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2010
Filed:
Apr. 03, 2008
Daniel W. Cervantes, Round Rock, TX (US);
Robert B. Gass, Pflugerville, TX (US);
Joshua P. Hernandez, Paige, TX (US);
Timothy M. Skergan, Austin, TX (US);
Daniel W. Cervantes, Round Rock, TX (US);
Robert B. Gass, Pflugerville, TX (US);
Joshua P. Hernandez, Paige, TX (US);
Timothy M. Skergan, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system and computer program product for performing real-time LBIST diagnostics of IC devices. During LBIST, stump data and identifiers of test cycles are saved in the IC device-under-test (DUT). If compressed stump data does not match a pre-defined coded value (i.e., 'signature' of the test cycle), the saved stump data and an identifier of the failed test cycle are preserved, otherwise the determination is made the DUT passed the test cycle. Identifiers and stump of the failed test cycles are used to analyze errors, including virtually non-reproducible errors.