The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2010
Filed:
Aug. 02, 2006
Jeffrey J. Grott, Irwin, PA (US);
Jeffery J. Williams, Mckees Rocks, PA (US);
Konrad Świrski, Warsaw, PL;
Tomasz Chomiak, Warsaw, PL;
Konrad Wojdan, Warsaw, PL;
Jeffrey J. Grott, Irwin, PA (US);
Jeffery J. Williams, Mckees Rocks, PA (US);
Konrad Świrski, Warsaw, PL;
Tomasz Chomiak, Warsaw, PL;
Konrad Wojdan, Warsaw, PL;
Emerson Process Management Power & Water Solutions, Inc., Pittsburgh, PA (US);
Abstract
An integrated optimization and control technique performs process control and optimization using stochastic optimization similar to that used in biological immune systems during on-line operation of a process, the technique collects and stores indications of process control states. During steady-state operation, the technique optimizes process operation by developing sets of process control inputs from stored process control states using an objective function that defines an optimality criterion. Moreover, after one or more disturbance inputs experiences a significant change, the technique responds by comparing the changed disturbance inputs to the disturbance inputs of at least some of the stored process control states to determine the stored process control states that are closest to the new process operating condition. The technique then develops a new set of control inputs based on the control inputs associated with the stored process control states determined to be closest to the new process operating condition.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile