The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2010
Filed:
Oct. 31, 2008
Geoffrey Harding, Hamburg, DE;
Helmut Rudolf Strecker, Hamburg, DE;
Geoffrey Harding, Hamburg, DE;
Helmut Rudolf Strecker, Hamburg, DE;
Morpho Detection, Inc., Newark, CA (US);
Abstract
A method to account for cross-talk among a plurality of coherent scatter detectors of a multi-detector inverse fan beam x-ray diffraction imaging (MD-IFB XDI) system. The MD-IFB XDI system includes a multi-focus x-ray source (MFXS) that emits radiation sequentially from a plurality of focus points denoted by F, F, . . . Fwith a running index i. The method includes measuring a diffraction profile Xfor each coherent scatter detector Dof the plurality of coherent scatter detectors. The diffraction profile includes a spectrum of a number of photons measured in a plurality of corresponding coherent scatter detectors. Each coherent scatter detector Dis corrected to remove scatter from a plurality of primary beams directed to remaining coherent scatter detectors of the plurality of coherent scatter detectors.