The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2010

Filed:

Nov. 04, 2005
Applicants:

Santosh Anikhindi, San Jose, CA (US);

Iain Botterill, San Francisco, CA (US);

Inventors:

Santosh Anikhindi, San Jose, CA (US);

Iain Botterill, San Francisco, CA (US);

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

By virtue of one embodiment of the present invention, dynamic signal to noise ratio measurements made on received signals are used to identify degraded segments of a channel. The degraded segments are then no longer used for transmitting payload data. In the context of an orthogonal frequency division multiplexing (OFDM) communication system, degraded OFDM subchannels, as determined on a real-time basis, are not used to transmit payload data. In an OFDM network where access is shared in the time domain among multiple transmitters and a single allocable time slot includes an integer number of OFDM bursts, the medium access control layer adjusts packet length, and therefore the amount of data to be included in a given slot, in response to the fluctuating number of available subchannels.


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