The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2010
Filed:
Jul. 21, 2006
Applicants:
Ralf Wolleschensky, Apolda, DE;
Hans-jürgen Dobschal, Kleinromstedt, DE;
Inventors:
Ralf Wolleschensky, Apolda, DE;
Hans-Jürgen Dobschal, Kleinromstedt, DE;
Assignee:
Carl Zeiss Microlmaging GmbH, Jena, DE;
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope objective including an front optical element, a plurality of optical elements spaced apart from the front element and from each other, as well as an adjusting unit. At least one of the optical elements can be displaced along the optical axis by the adjusting unit to adjust the focus of the objective. The focus of the objective is displaced relative to the front element along the optical axis and/or a temperature-induced imaging error of the objective is compensated for.