The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2010

Filed:

Oct. 15, 2007
Applicants:

Keith W. Lueck, Fenton, MO (US);

M. Rankine Forrester, St. Louis, MO (US);

Gary L. Sibley, St. Louis, MO (US);

John Mitchell, Manchester, MO (US);

Inventors:

Keith W. Lueck, Fenton, MO (US);

M. Rankine Forrester, St. Louis, MO (US);

Gary L. Sibley, St. Louis, MO (US);

John Mitchell, Manchester, MO (US);

Assignees:

Intoximeters, Inc., St. Louis, MO (US);

Alcotek, Inc., St. Louis, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

Interference detector and methods for detecting interference in a signal are described. More specifically, in one aspect, a method for detecting interference in a signal is provided. The method comprises determining whether the signal has at least one of a time and a frequency characteristic that is outside a predefined range, and determining that an interference event has been detected if the signal has at least one of such characteristics.


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