The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2010

Filed:

Nov. 29, 2006
Applicants:

Katsuaki Aida, Chiba, JP;

Hiroyuki Machida, Ichihara, JP;

Inventors:

Katsuaki Aida, Chiba, JP;

Hiroyuki Machida, Ichihara, JP;

Assignee:

Showa Denko K.K., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01); G11B 5/00 (2006.01); C03B 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a magnetic disk substrate, in which an amplitude Wa of a waviness on a surface measured by using an interferometer for a versatile disk at a measuring wave-length of 5.0 mm is within the range of 0.1 nm to 0.5 nm, an average amplitude Wb of a microwaviness generated on the waviness measured by using a microscopy for three-dimensional surface-structural analysis at a measuring wave-length of 30 μm to 200 μm is 0.3 nm or less, and a value calculated by dividing the average amplitude Wb of the microwaviness by the amplitude Wa of the waviness is 0.6 or more.


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