The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2010

Filed:

Nov. 07, 2005
Applicants:

Masakazu Kuki, Ichinomiya, JP;

Motoshi Kishi, Nagoya, JP;

Hirokazu Nakashima, Nishikasugai-gun, JP;

Inventors:

Masakazu Kuki, Ichinomiya, JP;

Motoshi Kishi, Nagoya, JP;

Hirokazu Nakashima, Nishikasugai-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
D05B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A printing and embroidering system having a positional data appending system that is adapted to append positional data indicating positions of a first image and a second image with respect to each other to first image data representing the first image to be formed by one of printing and embroidering and second image data representing the second image to be formed by the other one of printing and embroidering, a first image forming unit with a first fabric holding member, which is adapted to form the first image based on the first image data on a fabric being held by the first fabric holding member, and a second image forming unit with a second fabric holding member, which is adapted to form the second image based on the fabric being held by the second fabric holding member, wherein the first image forming unit is provided with a mark forming system, which is adapted to form a predetermined mark represented by the positional data on the fabric, and wherein the second image forming system is provided with a misalignment eliciting system, which is adapted to elicit a misalignment between a position of the predetermined mark formed on the fabric held by the second fabric holding member and a position represented by the positional data appended to the second image data prior to forming the second image.


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