The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Jan. 29, 2007
Applicants:
Hsiang-che Hsu, Taipei Hsien, TW;
Bowei Hsieh, Taipei Hsien, TW;
Inventors:
Hsiang-Che Hsu, Taipei Hsien, TW;
Bowei Hsieh, Taipei Hsien, TW;
Assignee:
VIA Technologies Inc., Hsin-Tien, Taipei Hsien, TW;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
Method and related system for testing a chip with high speed I/O functions are provided. The testing method of a chip includes the steps of: receiving a testing signal from a low speed bus; then transmitting the testing signal according to a transmission control signal; then receiving the testing signal according to a receiving control signal; and comparing the transmitted testing signal and the received testing signal to identify the I/O functions of the chip.