The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Aug. 06, 2009
Applicants:
Veera W. Deenadhayalan, Fremont, CA (US);
James Lee Hafner, San Jose, CA (US);
Krishnakumar Rao Surugucchi, Fremont, CA (US);
Inventors:
Veera W. Deenadhayalan, Fremont, CA (US);
James Lee Hafner, San Jose, CA (US);
Krishnakumar Rao Surugucchi, Fremont, CA (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system (and method) for determining reconstruction formulas for partial strip reconstruction in a storage system in which a plurality of lost strips have been detected, includes using a combination of a direct reconstruction method and a sequential reconstruction method.
Quick Actions:
Deenadhayalan, Veera. (2010). System and method for reconstructing lost data in a storage system (U.S. Patent No. 7853823). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7853823
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