The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2010

Filed:

Nov. 26, 2007
Applicants:

Auren Hoffman, San Francisco, CA (US);

Jeremy Lizt, San Francisco, CA (US);

Vivek Sodera, San Francisco, CA (US);

Manish Shah, San Francisco, CA (US);

Inventors:

Auren Hoffman, San Francisco, CA (US);

Jeremy Lizt, San Francisco, CA (US);

Vivek Sodera, San Francisco, CA (US);

Manish Shah, San Francisco, CA (US);

Assignee:

Rapleaf, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A reputability analysis system receives a domain assessment request associated with a domain and accesses a database to find a match for the domain. A reputability score is derived according to a hierarchical analysis of a matching domain in the database. Traceability, accountability, and association information associated with the domain assessment request may also be used to adjust the reputability score.


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