The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Sep. 08, 2006
Peiling Wu, Sterling Heights, MI (US);
Shang-tae Yee, Troy, MI (US);
Devadatta M. Kulkarni, Rochester Hills, MI (US);
Jeffrey D. Tew, Rochester, MI (US);
Peiling Wu, Sterling Heights, MI (US);
Shang-Tae Yee, Troy, MI (US);
Devadatta M. Kulkarni, Rochester Hills, MI (US);
Jeffrey D. Tew, Rochester, MI (US);
GM Global Technology Operations, Inc., Detroit, MI (US);
Abstract
Methods, systems and computer program products for supporting supply chain facility performance analysis. Methods include maintaining supply chain facility configuration information for a plurality of supply chain facilities. The method also includes identifying variables that are attributed to performance of the supply chain facilities. Data corresponding to one or more of the variables for selected supply chain facilities in the plurality of supply chain facilities is collected. Performance analysis is performed for the selected supply chain facilities using the data as input. The performance analysis includes executing a data envelope analysis (DEA) based three-stage performance analysis model, executing a statistical analysis and executing a sensitivity analysis. The results of the performance analysis are output. The results include a performance ranking of the selected supply chain facilities, a prescription for performance improvement, a correlation analysis, and a sensitivity analysis.