The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Mar. 20, 2007
Nikola Samardzija, Minnetonka, MN (US);
John Philip Miller, Eden Prairie, MN (US);
Nikola Samardzija, Minnetonka, MN (US);
John Philip Miller, Eden Prairie, MN (US);
Fisher-Rosemount Systems, Inc., Austin, TX (US);
Abstract
A system and method of monitoring and diagnosing on-line multivariate process variable data in a process plant, where the multivariate process data comprises a plurality of process variables each having a plurality of observations, includes collecting on-line process data from a process control system within the process plant when the process is on-line, where the collected on-line process data comprises a plurality of observations of a plurality of process variables and where the plurality of observations of the set of collected process data comprises a first data space having a plurality of dimensions, performing a multivariate statistical analysis to represent the operation of the process based on a set of collected on-line process data comprising a measure of the operation of the process when the process is on-line within a second data space having fewer dimensions than the first data space, performing a univariate analysis to represent the operation of the process as a multivariate projection of the on-line process data by a univariate variable for each of the process variables, where the univariate variable unifies the process variables, and generating a visualization comprising a first plot of a result generated by the multivariate statistical representation of the operation of the process and a second plot of a result generated by the univariate representation of the operation of the process.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile