The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Feb. 21, 2003
Scott David Wollenweber, Waukesha, WI (US);
Alex Ganin, Whitefish Bay, WI (US);
Mark K. Limkeman, Brookfield, WI (US);
Charles William Stearns, New Berlin, WI (US);
Scott David Wollenweber, Waukesha, WI (US);
Alex Ganin, Whitefish Bay, WI (US);
Mark K. Limkeman, Brookfield, WI (US);
Charles William Stearns, New Berlin, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
A method for retrospectively correcting data prior to image reconstruction using an imaging system, wherein the method includes acquiring a first sinogram of a first slice of an object at a first axial field of view and a second sinogram of the first slice of the object at a second axial field of view different than the first axial field of view, determining at least one boundary of the object in the first sinogram and the second sinogram at the first slice, measuring a shift between the first sinogram and the second sinogram using the determined boundaries, and generating a corrected image using the measured shift.