The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2010

Filed:

Nov. 19, 2009
Applicants:

Tetsuo Yamanaka, Tokyo, JP;

Kazuhiko Kobayashi, Tokyo, JP;

Tadashi Shinohara, Kanagawa-ken, JP;

Jun Hosokawa, Tokyo, JP;

Inventors:

Tetsuo Yamanaka, Tokyo, JP;

Kazuhiko Kobayashi, Tokyo, JP;

Tadashi Shinohara, Kanagawa-ken, JP;

Jun Hosokawa, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/01 (2006.01); G03G 21/16 (2006.01); B41J 2/385 (2006.01); G01D 15/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image forming apparatus including a plurality of detachable image forming devices each configured to form a color image, an image carrying device configured to carry the color images sequentially overlaid into a single color image, an exchange detecting device configured to detect an exchange operation of the plurality of detachable image forming devices, a test pattern reading device configured to read a predetermined test pattern formed by the plurality of detachable image forming devices on the image carrying device, and a controller configured to instruct the plurality of detachable image forming devices to form the predetermined test pattern on the image carrying device when the exchange detecting device detects the exchange operation, and to perform a color image position adjustment based on readings of the predetermined test pattern by the test pattern reading device.


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