The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Jul. 02, 2004
Stephen James Hardy, West Pymble, AU;
Peter Alleine Fletcher, Rozelle, AU;
Kieran Gerard Larkin, Putney, AU;
Stephen James Hardy, West Pymble, AU;
Peter Alleine Fletcher, Rozelle, AU;
Kieran Gerard Larkin, Putney, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A method () of determining at least rotation and scale parameters of a transformation relating two images is disclosed. The method () starts by forming a spatial domain representation of each of the images that is invariant to translation of the images. A correlation in the log-polar domain is next performed between the representations. After detecting a magnitude peak in the correlation, the method () determines the rotation and scale parameters from the position of the magnitude peak.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile