The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2010

Filed:

Jul. 26, 2005
Applicants:

Wen-yi Wu, Hsin-Chu Hsien, TW;

Meng-ta Yang, Miao- Li Hsien, TW;

Pi-hai Liu, Taipei, TW;

Inventors:

Wen-Yi Wu, Hsin-Chu Hsien, TW;

Meng-Ta Yang, Miao- Li Hsien, TW;

Pi-Hai Liu, Taipei, TW;

Assignee:

Mediatek Incorporation, Science-Based Industrial Park, Hsin-Chu Hsien, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 5/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A path metric computing method applied in a high-speed Viterbi detector and related apparatus thereof are disclosed. The path metric computing apparatus includes a comparator for generating a control signal according a plurality of previous path metrics, a combining circuit for generating a plurality of first output values according to the previous path metrics and branch costs of a plurality of branches of a current state, and a multiplexer, electrically connected to the comparator and the combining circuit, for determining a first path metric of the current state according to the control signal and the output values.


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