The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2010

Filed:

Oct. 17, 2008
Applicant:

Markus Berner, Niederhasli, CH;

Inventor:

Markus Berner, Niederhasli, CH;

Assignee:

Nectar Imaging S.R.L., Imola (BO), IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for tomographic scanning objects comprises a source of light for irradiating the object; a first grid arranged in the optical axis of the light beam so that a pattern of the first grid is projected on the object; an optical imaging assembly for imaging the object on a sensor; and a second grid provided in the optical axis of the reflected light beam having a pattern matching the first grid, through said second grid the reflected light beam having the pattern of the first grid being guided so that the sensor senses the light beam reflected by the object with a Moiré pattern resulting from overlying the pattern of the first grid and the pattern of the second grid. The device further comprises a means for moving the first grid and/or the second grid at a frequency causing fluctuations in the intensity of the resulting Moiré pattern.


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