The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2010

Filed:

Nov. 27, 2007
Applicant:

Yuji Kosugi, Utsunomiya, JP;

Inventor:

Yuji Kosugi, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/68 (2006.01); G03B 27/52 (2006.01);
U.S. Cl.
CPC ...
Abstract

An exposure apparatus includes a projection optical system for projecting light from a reticle onto a substrate, and exposes a shot region of the substrate to radiant energy via the reticle and the projection optical system. The exposure apparatus comprises a substrate stage configured to hold the substrate and to be moved, a console configured to set a valid area inside the shot region, a measuring device configured to measure a position of a surface of the substrate in a direction parallel to an optical axis of the projection optical system, and a controller configured to control a position of the substrate stage based on the position of the surface measured by the measuring device at a measurement point in the valid area set by the console, the measurement point being determined in accordance with a position of the substrate relative to the measuring device.


Find Patent Forward Citations

Kosugi, Yuji. (2010). Exposure apparatus (U.S. Patent No. 7852458). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7852458

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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