The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Jun. 28, 2004
Applicant:
Gerard Yeh, Redwood City, CA (US);
Inventor:
Gerard Yeh, Redwood City, CA (US);
Assignee:
Zoran Corporation, Sunnyvale, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for providing a high definition capture engine comprising an on-the-fly scaler to perform horizontal and vertical scaling as needed, prior to storage of the data in a buffer.
Yeh, Gerard. (2010). Method and apparatus for high definition capture (U.S. Patent No. 7852405). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7852405
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile