The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Nov. 03, 2008
Stefan C. Lauxtermann, Camarillo, CA (US);
Adam Lee, Portland, OR (US);
John Stevens, Porter Ranch, CA (US);
Stefan C. Lauxtermann, Camarillo, CA (US);
Adam Lee, Portland, OR (US);
John Stevens, Porter Ranch, CA (US);
Teledyne Scientific & Imaging, LLC, Thousand Oaks, CA (US);
Abstract
A correlated double sampling circuit and method for providing the same are disclosed. The circuit may include an amplifier, a plurality of capacitors, and a switch matrix. The amplifier provides a reset voltage replica and a signal voltage replica. The switch matrix controls a plurality of switches to perform correlated double sampling over at least three phases. The first phase for sampling the reset voltage replica on a first and second capacitors. The second phase for sampling the reset voltage replica and the kTC noise on a third capacitor. The first phase producing a thermal kTC noise from the first and second capacitors. The third phase for subtracting a charge representing the signal voltage replica, the kTC noise and the reset voltage replica, combined, from the charge sampled in the second phase to provide an output voltage. The method for providing low noise correlated double sampling includes controlling the plurality of switches to provide the at least three phases.