The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Dec. 06, 2006
Matthew E. Chraft, Copperopolis, CA (US);
Benjamin N. Eldridge, Danville, CA (US);
Roy J. Henson, Pleasanton, CA (US);
A. Nicholas Sporck, Saratoga, CA (US);
Matthew E. Chraft, Copperopolis, CA (US);
Benjamin N. Eldridge, Danville, CA (US);
Roy J. Henson, Pleasanton, CA (US);
A. Nicholas Sporck, Saratoga, CA (US);
FormFactor, Inc., Livermore, CA (US);
Abstract
Probes in a plurality of DUT probe groups can be connected in parallel to a single tester channel. In one aspect, digital potentiometers can be used to effectively switch the tester channel from a probe in one DUT probe group to a probe in another DUT probe group. In another aspect, switches in parallel with a resistor can accomplish such switching. In yet another aspect, a chip select terminal on each DUT can be used to effectively connect and disconnect internal DUT circuitry to the tester channel. Multiple DUT probe groups so connected can be used to create different patterns of DUT probe groups for testing different patterns of DUTs and thus facilitate sharing tester channels.