The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Jan. 22, 2008
Manabu Komatsu, Kawasaki, JP;
Hiroyuki Hashimoto, Yokohama, JP;
Yohei Murayama, Tokyo, JP;
Kazuhiro Ban, Tokyo, JP;
Manabu Komatsu, Kawasaki, JP;
Hiroyuki Hashimoto, Yokohama, JP;
Yohei Murayama, Tokyo, JP;
Kazuhiro Ban, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A method for obtaining information on a mass of an object by time-of-flight mass spectrometry. This method includes placing colloidal metal particles for promoting ionization of the object inside the object at a depth ranging from 0.1 nm to 100 nm in opposition to a primary beam for the ionization; irradiating the object with the primary beam selected from the group of ions, neutral particles, and electrons, which can be focused, pulsed, and are capable of scanning, and laser beams, which can be focused, pulsed, and are capable of scanning to ionize a constituent of the object and to allow the ionized constituent to fly out of the object; and obtaining information on the mass of the flying constituent of the object by time-of-flight mass spectrometry.