The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Jun. 05, 2007
Takafumi Ito, Tokyo, JP;
Masazumi Hara, Tokyo, JP;
Masahiro Egi, Tokyo, JP;
Takahiro Doi, Tokyo, JP;
Takafumi Ito, Tokyo, JP;
Masazumi Hara, Tokyo, JP;
Masahiro Egi, Tokyo, JP;
Takahiro Doi, Tokyo, JP;
Satake Corporation, Tokyo, JP;
Abstract
An optical cracked-grain selector that does not mistakenly identify normal grains of rice having no cracks as cracked grains due to the presence of the embryonic portion and/or surface scratches when optically identifying cracked grains of rice mixed in with material rice grains. An identification part in a cracked grain identification unit obtains a first rice grain image (having an embryonic portion and scratches) based on light passed through the rice grain that is received by a first CCD sensor built into a CCD camera of a photoreaction detection unit and a second rice grain image (having cracks, an embryo portion and scratches) based on light passed through the rice grain received by a second CCD sensor built into the CCD camera, acquires an image of the cracks by calculating a difference in the amount of light between the two rice grain images, and identifies a cracked grain.