The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2010

Filed:

Feb. 23, 2006
Applicants:

Mark W. Brenner, Ida Grove, IA (US);

Raymond J. Bumann, Iii, Ida Grove, IA (US);

Gary L. Godbersen, Ida Grove, IA (US);

James W. Honea, Pleasanton, CA (US);

Inventors:

Mark W. Brenner, Ida Grove, IA (US);

Raymond J. Bumann, III, Ida Grove, IA (US);

Gary L. Godbersen, Ida Grove, IA (US);

James W. Honea, Pleasanton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05D 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A smoothness indicator analysis system generates a comprehensive report and a graphic user interface display useful for planning pavement projects and future maintenance of a paved road. The smoothness indicator analysis system includes an information handling system for analyzing elevation information collected and measured by a smoothness indicator. The information handling system may be configured to receive user selections and input parameters through a graphic user interface. Based on the user selections and the input parameters, the elevation information is analyzed and various reports are generated. An amount of paving material required for a given portion of the road surface and the pavement thickness of a given portion of the road surface may be estimated.


Find Patent Forward Citations

Brenner, Mark. (2010). Smoothness indicator analysis system (U.S. Patent No. 7850395). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7850395

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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