The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Apr. 04, 2008
Jun Yasutani, Kawasaki, JP;
Hitoshi Nishikori, Inagi, JP;
Takeshi Yazawa, Yokohama, JP;
Satoshi Seki, Kawasaki, JP;
Fumiko Yano, Tokyo, JP;
Atsushi Takahashi, Kawasaki, JP;
Jun Yasutani, Kawasaki, JP;
Hitoshi Nishikori, Inagi, JP;
Takeshi Yazawa, Yokohama, JP;
Satoshi Seki, Kawasaki, JP;
Fumiko Yano, Tokyo, JP;
Atsushi Takahashi, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
The sequence of the acquisition of a correction value of a conveying error depending on the eccentricity of the conveying roller (correction value for eccentricity) and the acquisition of a correction value of a conveying error depending on the outer diameter of the roller (correction value for outer diameter) is considered to acquire a precise correction value for outer diameter. A test pattern to acquire the correction values for eccentricity and for outer diameter is formed with an area exceeds the area corresponding to an integer multiple of the circumferential length of the roller. The correction value for eccentricity and that for outer diameter are acquired in this sequence. The fluctuation in the conveying error is reduced by the application of the correction value for eccentricity, and the influence of the excess area is made smaller before the correction value for outer diameter is acquired by averaging the conveying errors.