The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2010

Filed:

May. 12, 2005
Applicants:

Tetsushi Kasahara, Osaka, JP;

Tomoaki Izumi, Osaka, JP;

Masahiro Nakanishi, Kyoto, JP;

Kazuaki Tamura, Osaka, JP;

Kiminori Matsuno, Osaka, JP;

Yoshihisa Inagaki, Osaka, JP;

Manabu Inoue, Osaka, JP;

Inventors:

Tetsushi Kasahara, Osaka, JP;

Tomoaki Izumi, Osaka, JP;

Masahiro Nakanishi, Kyoto, JP;

Kazuaki Tamura, Osaka, JP;

Kiminori Matsuno, Osaka, JP;

Yoshihisa Inagaki, Osaka, JP;

Manabu Inoue, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An address at which a writing error occurs is held, and after a completion of a series of writings, the data of the held address is read. Then, a faulty-block processing is performed only for the addresses, for which it is determined that retry of writing is required, thereby preventing an increase of faulty-blocks. This can suppress the problem that when a writing is performed in a particular flash memory, a writing error frequently occurs and a large number of faulty blocks occur.


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