The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2010

Filed:

Sep. 24, 2007
Applicants:

Yong Cheol Park, Gwachon-si, KR;

Sung Dae Kim, Gunpo-si, KR;

Inventors:

Yong Cheol Park, Gwachon-si, KR;

Sung Dae Kim, Gunpo-si, KR;

Assignee:

LG Electronics Inc., Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/44 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, apparatus and recording medium for managing defects are discussed. According to an embodiment, the method includes allocating at least one spare area to the recording medium, and at least one temporary defect management area to the spare area when a plurality of temporary defect management areas are to be separately provided; recording defect management information on a first temporary defect management area; and recording defect management information on a second temporary defect management area after the first temporary defect management area is full, the second temporary defect management area being allocated to the spare area.


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