The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2010

Filed:

Jun. 12, 2007
Applicants:

Vijayan Prabhakaran, Sunnyvale, CA (US);

Venugopalan Ramasubramanian, Mountain View, CA (US);

Lidong Zhou, Sunnyvale, CA (US);

Roy Levin, Palo Alto, CA (US);

Chandramohan A. Thekkath, Palo Alto, CA (US);

Inventors:

Vijayan Prabhakaran, Sunnyvale, CA (US);

Venugopalan Ramasubramanian, Mountain View, CA (US);

Lidong Zhou, Sunnyvale, CA (US);

Roy Levin, Palo Alto, CA (US);

Chandramohan A. Thekkath, Palo Alto, CA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Multiple versions of data on different sets of machines allow a system to degrade gracefully even when experiencing excessive failures. When excessive failures cause the latest versions to be unavailable, the system becomes degraded, but still offers an old version if available. A most recent coherent set of the available older versions is found and provided. The degree of degradation increases gradually as the system experiences more and more failures. Graceful degradation is desirably complementary to fault tolerance.


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