The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2010

Filed:

Oct. 30, 2007
Applicants:

Sundeep Abraham, Belmont, CA (US);

Wesley C. Lin, West Covina, CA (US);

Yasuhiro Matsuda, Palo Alto, CA (US);

Mohammad Faisal, Belmont, CA (US);

Geeta Arora, Union City, CA (US);

Inventors:

Sundeep Abraham, Belmont, CA (US);

Wesley C. Lin, West Covina, CA (US);

Yasuhiro Matsuda, Palo Alto, CA (US);

Mohammad Faisal, Belmont, CA (US);

Geeta Arora, Union City, CA (US);

Assignee:

Oracle International Corp., Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/20 (2006.01); G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems, methods, and other embodiments associated with selectively acquiring and utilizing query statistics are described. One example method includes selectively acquiring statistics associated with search queries submitted to a search process during a sample period. The statistics may be associated with an index and tokens associated with the index and search queries. The method may also include selecting tokens and/or queries to optimize based, at least in part, on the statistics. In one example, whether and/or how the tokens and/or queries are optimized may depend on estimating index fragmentation based, at least in part, on the statistics.


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