The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2010
Filed:
Jul. 31, 2006
Applicants:
Xiangchao Gan, Mang Zhang, CN;
Alan Wee-chung Liew, Tseung Kwan O, HK;
Hong Yan, Glebe, AU;
Inventors:
Assignee:
City University of Hong Kong, Kowloon, HK;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01); G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
Abstract
Gene expression, or other data is analyzed for the presence of biclusters. The data is represented as geometric data. Lines, planes and/or hyperplanes are detected in the geometric data using a transform such as a Hough Transform or its variations. The detected lines, planes and hyperplanes are analyzed to determine if they correspond to biclusters in the original data.