The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2010

Filed:

Feb. 13, 2004
Applicants:

Maryellen L. Giger, Elmhurst, IL (US);

Hui LI, Chicago, IL (US);

Inventors:

Maryellen L. Giger, Elmhurst, IL (US);

Hui Li, Chicago, IL (US);

Assignee:

The University of Chicago, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computerized method, system and computer program for the computerized fractal-based analysis of a structure as presented in a pattern on a medical image. Image data is generated from the medical image and a region of interest is selected. The image data is digitized and analyzed to reveal fractal-based computer-generated features of a texture of the image data. Then a qualifier is applied to the computer-generated features to obtain fractal characteristics of the image data. A multi-fractal nature is observed for the texture of the region of interest. A marker for assessing a risk of a disease is yielded based on the multi-fractal nature of the texture.


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