The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2010

Filed:

Mar. 01, 2007
Applicants:

Tomoyuki Takeguchi, Kanagawa, JP;

Tatsuo Kozakaya, Kanagawa, JP;

Masahide Nishiura, Tokyo, JP;

Osamu Yamaguchi, Kanagawa, JP;

Mayumi Yuasa, Kanagawa, JP;

Inventors:

Tomoyuki Takeguchi, Kanagawa, JP;

Tatsuo Kozakaya, Kanagawa, JP;

Masahide Nishiura, Tokyo, JP;

Osamu Yamaguchi, Kanagawa, JP;

Mayumi Yuasa, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for detecting a feature point includes an image input unit that inputs an image of the target object; a three-dimensional shape information holding unit that stores three-dimensional shape information including reference feature points of a model relating to the target object; a correspondence relation acquiring unit that acquires a correspondence relation between the input image and the three-dimensional shape; a seek area acquiring unit that acquires image information of a seek area on the input image corresponding to an area including a point corresponding to the specific feature point in the model on the basis of the correspondence relation; and a feature point detecting unit that detects the position of the specific feature point in the input image from the image information.


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