The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2010
Filed:
Oct. 15, 2007
Shuichi Takada, Yokohama, JP;
Shuichi Takada, Yokohama, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
A semiconductor integrated circuit has first and second delay circuits that have n (n is an integer equal to or larger than 2) delay elements connected in series, respectively, and in which an identical input signal is inputted to delay elements at a first stage and output signals of delay elements at a kth (k is an integer satisfying a condition 1≦k≦n−1) stage are inputted to delay elements at a k+1th stage and a detection circuit that has n edge detecting units and a readout unit and in which a jth (j is an integer satisfying a condition 1≦j≦n) edge detecting unit is inputted with an output signal of a delay element at a jth stage of the first delay circuit and an output signal of a delay element at an n−j+1th stage of the second delay circuit, detects whether periods of rising or falling changes of the two signals overlap, and counts a number of times of the detection, and the readout unit reads out the counted number of times of the detection.