The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2010
Filed:
Sep. 02, 2005
Carmela Cozzo, Cary, NC (US);
Douglas A. Cairns, Durham, NC (US);
Gregory E. Bottomley, Cary, NC (US);
Ali S. Khayrallah, Cary, NC (US);
Håkan B. Eriksson, Täby, SE;
Carmela Cozzo, Cary, NC (US);
Douglas A. Cairns, Durham, NC (US);
Gregory E. Bottomley, Cary, NC (US);
Ali S. Khayrallah, Cary, NC (US);
Håkan B. Eriksson, Täby, SE;
Telefonaktiebolaget LM Ericsson (publ), Stockholm, SE;
Abstract
A wireless communication receiver, such as the receiver included in a wireless communication transceiver implemented in a base station or in a mobile station of a wireless communication network, includes a parametric G-RAKE receiver circuit and a method that compute parametric scaling parameters on a per transmission interval basis. In one embodiment, measured impairment correlations are obtained for an individual transmission slot and used to estimate instantaneous values of the scaling parameters. One or both of those instantaneous values are then constrained according to one or more defined limits. In other embodiments, multiple transmission slots are used to increase the number of measurements available to estimate the scaling parameters, with parameter constraining optionally applied. Further embodiments use iterative methods and/or solve for one parameter, and use the results to obtain the other parameter(s). One or more of these embodiments can be improved through the use of error correction/detection information.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile