The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2010

Filed:

Feb. 21, 2008
Applicant:

Wallace Smith, Sea Girt, NJ (US);

Inventor:

Wallace Smith, Sea Girt, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G06F 11/00 (2006.01); G08C 15/00 (2006.01); H04J 1/16 (2006.01); H04J 3/14 (2006.01); H04L 1/00 (2006.01); H04L 12/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus enabling the measurement of one way delay in each of the two directions of transmission from a single location are disclosed. The method measures a first roundtrip delay at a first location between a first endpoint and a second endpoint over a first communication network, and measures a second roundtrip delay between a third endpoint and a fourth endpoint over a second communication network with symmetric delay characteristics. The method performs synchronous recordings of a test signal that is sent simultaneously from the second endpoint to the first endpoint and from the fourth endpoint to the third endpoint, to measure an arrival time (t) of the test signal over the first communication network, and, an arrival time (t) of the test signal over the second communication network t, where the arrival times (t) and (t) are used to calculate an one way transmission delay in the first communication network.


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